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Precision in Every Connection
High-Precision Resistivity & Sheet Resistance Measurement
Four-Point Probe Tester
Measure resistivity, sheet resistance, and bulk resistance of thin films, semiconductors, silicon wafers, and solid materials with laboratory-grade precision. Trusted by Tsinghua University, Beihang University, and the University of Queensland.
✓ Resistivity
✓ Sheet Resistance
✓ Bulk Resistance
✓ PC Software Included
✓ Auto Test Platform Available
Trusted by Leading Research Institutions
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Tsinghua University
Materials Science Dept.
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Beihang University
Electronics Research Lab
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University of Queensland
Australia
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20+ Years
Manufacturing Experience
What Is a Four-Point Probe Tester?
A four-point probe tester measures electrical resistance, resistivity, and sheet resistance of solid materials by applying current through two outer probes and measuring voltage across two inner probes. This four-probe method eliminates contact resistance from the measurement, delivering significantly higher accuracy than two-probe methods.
It is the standard method in materials science and semiconductor research for characterising thin films, semiconductor wafers, conductive coatings, and bulk solid samples.
Note: Four-point probe testers are designed for solid materials only. Liquids and powders cannot be measured directly — liquid samples must first be solidified into a thin film before testing.
What Can Be Measured
✓ Thin films
✓ Silicon wafers
✓ Semiconductor materials
✓ Conductive coatings
✓ ITO glass
✓ Metal foils
✓ Bulk solid samples
✓ Solidified thin films
Target Applications
✗ Liquid samples
✗ Powder materials
Choose Your Model
Three models designed for different laboratory needs — from entry-level manual operation to fully automated high-throughput testing.
Detailed Model Comparison
Full technical specifications across all three models. All QSNTECH instruments achieve measurement uncertainty ≤2%, significantly better than the industry standard of ≤5%.
| Specification | SZT-2A | SZT-2B | SZT-2C |
|---|---|---|---|
| Resistivity Range | 10⁻⁴ ~ 10⁵ Ω·cm | 10⁻⁴ ~ 10⁶ Ω·cm | 10⁻⁵ ~ 10⁵ Ω·cm |
| Sheet Resistance | 10⁻⁴ ~ 10⁵ Ω/□ | 10⁻⁴ ~ 10⁶ Ω/□ | 10⁻⁴ ~ 10⁶ Ω/□ |
| Resistance Range | 10⁻⁴ ~ 10⁵ Ω | 10⁻⁴ ~ 10⁶ Ω | 10⁻⁵ ~ 10⁵ Ω |
| Current Output | DC 0–100mA 10μA / 100μA / 1 / 10 / 100mA |
DC 0–100mA 1 / 10 / 100μA, 1 / 10 / 100mA |
0.1μA–100mA Continuously adjustable |
| Measurement Error | ±0.5% ±1 digit | ±0.5% ±1 digit | ±0.1% (voltage) |
| Uncertainty | ≤2% | ≤2% | ≤2% |
| Display | 4½-digit LCD | LCD | 4½-digit colour LCD |
| Probe Spacing | 1mm | 1mm | 1mm ±0.01mm Customisable |
| Probe Material | Tungsten carbide | Tungsten carbide | Tungsten carbide |
| Sample Size | Ø5–200mm Length ≤400mm |
Ø5–200mm Length ≤400mm |
Customisable |
| Correction Factor | ✓ Automatic | ✓ Automatic | ✓ Automatic |
| PC Software | ✓ Included | ✓ Included | ✓ USB + Software |
| Auto Test Platform | — | Optional | ✓ Included |
| Power Supply | 220V ±10% 50/60Hz <35W |
220V ±10% 50/60Hz |
220V ±10% 50/60Hz |
| Best For | Standard lab use Thin films & wafers |
Research & semiconductor Widest measurement range |
High-throughput Industrial & automation |
Note on Correction Factor: All three models automatically apply the geometric correction factor (based on Smits’ formula) according to your sample shape and dimensions. Simply input the sample thickness and diameter — the instrument calculates the correct factor without manual adjustment. This is especially important for samples that are not infinitely large relative to probe spacing.
Full specification sheets available to download below. Contact us to confirm compatibility with your specific sample type.
Why QSNTECH vs Other Manufacturers
≤2%
Measurement Uncertainty
vs ≤5% typical for domestic competitors
0.1mΩ
Minimum Resolution
High-precision circuitry for low-resistance samples
WC
Tungsten Carbide Probes
Superior to high-speed steel probes used by other brands
Auto
Correction Factor
No manual adjustment needed — all models
Probe Selection Guide
The probe is the most critical component in a four-point probe system. Choosing the correct probe tip geometry and spacing for your sample type directly affects measurement accuracy.
Standard Tungsten Probes
1mm tip radius. Suitable for most thin film and bulk solid samples. Standard probe spacing of 1mm.
Best for: General lab use, thin films, semiconductor wafers
Fine-Tip Probes
Smaller contact area for fragile or thin samples where reduced probe pressure and minimal surface damage are required.
Best for: Fragile films, soft semiconductor surfaces
Custom Probe Spacing
Non-standard probe spacings available for specific sample dimensions or research requirements. Contact us with your specifications.
Best for: Custom research, non-standard sample sizes
Optional Upgrade
Why Choose the Automatic Test Platform?
Manual probe placement introduces variability in applied force — a key source of measurement error. The automatic test platform eliminates this by delivering consistent, controlled probe pressure on every measurement.
1
Consistent Probe Pressure
Eliminates operator-dependent variability. Every measurement uses the same controlled force.
2
Extended Probe Lifespan
Controlled descent reduces mechanical stress on probe tips, significantly lowering replacement frequency and cost.
3
Higher Throughput
Faster measurement cycles with repeatable positioning. Ideal for production QC and high-volume research sampling.
4
Sample Protection
Prevents damage to fragile or expensive samples from excessive manual pressure.
What’s Included
Every SZT series system ships as a complete, ready-to-use package. No additional components required to begin measuring.
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Main Equipment
With USB interface and 4½-digit LCD display
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Auto Test Frame
Automatic sensing device, controls probe pressure
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PC Software
Data acquisition, storage, and export
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English Manual
Full operation and specification documentation
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Cable
Connection cable for probe head
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4-Point Probe Head
Tungsten carbide tips, 1mm spacing
Technical Downloads
Full documentation available before purchase. Review specifications, operation procedures, and model comparisons before sending your inquiry.
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Product Catalogue
All models overview — PDF
Model Comparison Guide
SZT-2A vs 2B vs 2C — PDF
SZT-2A Manual
English operation manual — PDF
SZT-2B Manual
English operation manual — PDF
SZT-2C Manual
English operation manual — PDF
Probe Specifications
Probe types and selection — PDF
Who Uses Four-Point Probe Testers?
Our instruments are used across academic research, government labs, and industrial production environments.
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University Departments
Materials science, physics, electronics, and chemistry departments measuring thin film samples, semiconductor substrates, and research specimens.
Tsinghua · Beihang · Queensland
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Research Institutions
Government and private research institutes characterising advanced materials, novel coatings, and experimental semiconductor structures where measurement accuracy and data traceability are critical.
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Semiconductor & Industry
Production QC for semiconductor wafers, thin film deposition monitoring, ITO coating uniformity checks, and incoming material inspection in electronics manufacturing.
Technical Resources
In-depth guides written from the manufacturer’s perspective to help you select, use, and get the most from your four-point probe system.
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How to Choose a Four-Point Probe Tester
Key parameters to evaluate before purchasing — current range, sample size, probe spacing, and automation needs.
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Procurement Guide for University Labs
Practical buying guide for materials science and electronics departments — what to specify and what to avoid.
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Four-Point Probe for Thin Films
How to accurately measure sheet resistance and resistivity of thin film samples with correction factor guidance.
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Diverse Applications of Four-Point Probes
From semiconductor wafers to ITO glass — a comprehensive overview of measurement applications and sample types.
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Auto vs Manual Test Platform
Detailed comparison of automatic and manual probe stands — accuracy, probe life, throughput, and cost.
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Probe Selection Guide
How to select probe tip geometry, spacing, and material for your specific sample type and measurement application.
Frequently Asked Questions
Can I measure liquids or powders?
No. The four-point probe method requires solid samples with a stable flat surface. Liquids cannot be measured directly. If your sample is a liquid-phase material, it must first be deposited or solidified into a thin film before measurement.
What is the difference between resistivity and sheet resistance?
Resistivity (Ω·cm) is a bulk material property independent of sample geometry. Sheet resistance (Ω/□) is used for thin films where thickness is uniform — it represents resistance per square of any size. Our instruments can measure and display both values directly.
Which model is right for my university lab?
For most university materials science or electronics labs, the SZT-2A or SZT-2B is sufficient. If your lab runs high sample volumes, needs batch testing, or works with fragile wafers, the SZT-2C with automatic test platform is recommended.
What sample size and thickness can be measured?
The SZT series supports a wide range of sample sizes. The minimum usable sample area depends on probe spacing. Contact us with your specific sample dimensions and we can confirm compatibility and recommend correction factors.
Do you provide PC software and data export?
Yes. All three models include PC software for data acquisition, storage, and export. The software displays measurement results in real time and supports data export for further analysis in Excel or laboratory data management systems.
Can you ship internationally and provide technical support?
Yes. We export to universities, research institutions, and importers worldwide. Technical documentation, user manuals, and after-sales support are provided in English. Contact us for shipping lead times and customs documentation requirements.
Ready to Order or Have a Technical Question?
Whether you need a standard model, custom probe configuration, or want to discuss which system suits your sample type and research workflow — our team is ready to help.
📧 sales@testleadsworld.com
💬 WhatsApp: +86 13906512387
⏱ Response within 12 hours