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High-Precision Resistivity & Sheet Resistance Measurement System

The SZT-2A Four-Point Probe Tester, manufactured by QSNTech, is a high-accuracy instrument for semiconductor research, conductive thin-film measurements, photovoltaic materials, and general resistivity measurements. Its advanced circuit architecture, carbide tungsten probe system, and intelligent software deliver fast, precise, and repeatable measurements required by laboratories and industrial users.

⭐ Key Features & Advantages

High Accuracy & Fast Measurement

Standard measurement uncertainty ≤ 2%, significantly better than the typical domestic level (≤ 5%).
High-stability current source with automatic voltage/current correction.
Minimum resolution: 0.1 mω, ideal for ultra-low-resistance materials.

Intelligent Auto-Calculation Software

Automatically calculates resistivity and sheet resistance.
Applies sample-thickness correction for higher accuracy.
Allows storing, comparing, and deleting measurement data.
Integrated temperature compensation improves repeatability.

Premium Tungsten Carbide Probe System

Probe spacing: 1 mm (standard for scientific four-probe testing).
Material: Tungsten carbide, stronger and more durable than general high-speed steel.
Mechanical wander rate: ±1.0%, ensuring long-term consistency.
An automatic sensor prevents excessive pressure, protecting both the sample and the probe.

Hybrid Manual + Automatic Structure

Main unit: manual constant-current control ensures stable output.
Test stand: automatic pressure control, improving repeatability and reducing human error.

Suitable for Laboratory & Field Applications

Compact and stable, SZT-2A is ideal for:

University laboratories
Semiconductor R&D
Material production lines
Photovoltaic research
Field analysis environments

📐 Technical Specifications

Parameter	Specification
Resistance Range	10⁻⁴ ~ 10⁵ Ω
Sheet Resistance	10⁻⁴ ~ 10⁵ Ω/□
Resistivity	10⁻⁴ ~ 10⁵ Ω-cm
Minimum Resolution	0.1 mΩ
Constant Current Source	0–100 mA continuously adjustable
Current Ranges	10 μA, 100 μA, 1 mA, 10 mA, 100 mA
Display	4½-digit LCD, polarity, overload indication, automatic decimal point
Sample Size	Diameter 5–200 mm / Length ≤ 400 mm
Probe Spacing	1 mm
Probe Material	Tungsten carbide
Power Supply	220 ± 10%, 50/60 Hz
Power Consumption	< 35W

Measurement range		Constant current source
Resistivity	10^-4 ~ 10⁵Ω-cm	Current output	DC 0~100mA continuously adjustable.
Square resistance	10^-4 ~ 10⁵Ω/□	Range	10, 100μA, 1, 10, 100mA
Resistance	10^-4 ~ 10⁵Ω	Error range	± 0.5% number ± 1
Measurable semiconductor material size		Four-probe test probe
Diameter:	5mm-200mm	Probe spacing:	1mm
Length:	≤400mm	Material:	Tungsten carbide.Probe mechanical wander rate: ±1.0%
Measurement method		Display
Axial, cross-sectional can be		4 1/2, digital display, polarity, overload auto-show, Automatic display of decimal points and units
Power supply	220±10% 50Hz or 60Hz Power consumption:< 35W

🧪 Measurement Method

The SZT-2A applies a constant current through the outer probes, while the inner probes measure the voltage drop across the sample.
Using the Kelvin four-probe method eliminates errors caused by:

Lead resistance
Contact resistance
Probe pressure differences
Thermal EMF

The system then automatically computes:

Resistivity (Ω·cm)
Sheet resistance (Ω/□)
Converted thickness-corrected values

This ensures stable and repeatable results for conductive films, wafers, and semiconductor materials.

🏅 Why Choose QSNTech Four-Point Probe Testers?

20+ years of specialised manufacturing experience
Tungsten carbide probes for long service life
Calibration data with official stamp included
Trusted by professional labs and industrial users
Fast delivery and responsive global technical support

🙋‍♂️ FAQs — Frequently Asked Questions

Q1: What is a Four-Probe Tester, and why is it essential?

A Four-Probe Tester is a specialised device for precise electrical measurements. Using four independent contact points eliminates lead resistance errors, ensuring highly accurate results for scientific and industrial applications.

Q2: How does the Qiansineng Four-Probe Tester differ from traditional testers?

The Qiansineng SZT-2A stands out with:

Advanced circuit design
Automatic correction algorithms
Durable tungsten carbide probes
1 mm scientific spacing
Fast, stable measurement performance

It provides far higher accuracy and usability than traditional resistance meters.

Q3: Can beginners use the Four-Probe Tester?

Yes. The system is designed for ease of use, with:

Intuitive LCD interface
Automatic data processing
User-friendly operation steps

Even new users can quickly learn to operate it.

Q4: Where can I purchase the Qiansineng Four-Probe Tester?

You can order directly from our official website:
👉 https://testleadsworld.com/category/products/four-point-probe-tester

We provide fast global delivery and professional customer support.

Q5: Is customer support available?

Yes. Our engineers provide:

Technical consultation
Operation training
Probe selection guidance
Calibration assistance

You can contact our team anytime through the website.

Q6: Can the SZT-2A be used for both laboratory and field applications?

Absolutely. Its compact structure and stable performance make it ideal for:

University laboratories
Semiconductor testing environments
Field measurement scenarios

Q7: What materials can the SZT-2A measure, and is the probe spacing fixed?

The SZT-2A is designed for a wide range of conductive and semiconductive materials, including:

Thin films (ITO, AZO, conductive coatings)
Silicon wafers and semiconductor substrates
Metal plates and foils
Conductive glass
Carbon-based materials
Oxide-coated or doped substrates

The probe spacing of the SZT-2A is fixed at the industry-standard 1 mm, ensuring:

Consistent measurement geometry
Comparable results across laboratories
Higher repeatability and reduced measurement deviation

This fixed-spacing configuration is widely used in universities, research labs, and industrial material evaluation.

Q8: Why should I use a four-point probe instead of a two-point method?

Two-point measurements include contact and lead resistance, which can significantly distort results.
The four-point probe method eliminates these errors, yielding accurate resistivity measurements, which is especially important for low-resistance or thin-film materials.

Q9: Is the probe spacing fixed?

Yes. The SZT-2A uses a standard fixed probe spacing (typically 1 mm) to ensure consistent measurement geometry and reliable data comparison.

Q10: Does the tester support computer data collection?

Yes. The SZT-2A supports PC connection and measurement software, allowing users to store, analyse, and export test data for reports or research documentation.

Q11: Is recalibration required during everyday use?

In most cases, no.
The instrument is factory-calibrated, and laboratories with standard resistance boxes can readily verify its accuracy as needed. Long-term user feedback shows recalibration is rarely required.

📦 Package Includes

SZT-2A main host
Automatic test stand
Tungsten carbide four-probe head
Software + computer cable
Power cable
User manual
Calibration data (official stamped copy)

📞 Need a quotation or technical advice?

Our engineers can recommend the appropriate probe type based on whether your sample is soft (thin film) or hard (silicon or substrates).

👉 Contact us today: https://testleadsworld.com/contact/

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SZT-2A Four-Point Probe Tester

High-Precision Resistivity & Sheet Resistance Measurement System